Serrano Pedraza, Ignacio, y Vicente Sierra Vázquez. «The Effect of White-Noise Mask Level on Sinewave Contrast Detection Thresholds and the Critical-Band-Masking Model». The Spanish Journal of Psychology, vol. 9, n.º 2, noviembre de 2006, pp. 249-62, https://revistas.ucm.es/index.php/SJOP/article/view/SJOP0606220249A.