Serrano Pedraza I. . y Sierra Vázquez V. . (2006). The Effect of White-Noise Mask Level on Sinewave Contrast Detection Thresholds and the Critical-Band-Masking Model. The Spanish Journal of Psychology, 9(2), 249-262. https://revistas.ucm.es/index.php/SJOP/article/view/SJOP0606220249A